RADLAS 2017

	TECHNICAL PROGRAM
8:45	Registration
9:00	Welcome
	KEYNOTE INTRODUCTION
9:10	Basics & state of the art of single-photon laser testing methodologies Florent Miller, Nucletudes
	SESSION 1: Research topics and latest developments
9:30	Single Event Effects in AlGaN/GaN HEMTs Steve Buchner, Naval Research Laboratory
	Focus on modeling & calibration
9:50	Single-photon and two-photon absorption induced charge model calibration Vincent Pouget, IES-CNRS
10:10	Two-Photon-Absorption-Induced Carrier Generation: Calibration, Modeling, and Experimental Validation Dale McMorrow, Naval Research Laboratory
10:30	Break
	SESSION 2: Facilities & Methods
10:45	Two wavelength laser testing for SET prediction in analog circuit Sebastien Morand, Airbus Defence and Space
11:00	Laser tests and transient measurements on Schottky diodes Maxime Mauguet, Trad / INSA LPCNO
11:15	Integrated pulsed laser scanning microscope system at NTU, Singapore Samuel Chef, Nanyang Technological University
11:30	Investigation of Single-Event Effects for Micro and Nano Devices Using Pulsed Laser in NSSC Jianwei Han, NSSC CAS
11:45	Recent advances in SEE qualification tests of modern VLSI ICs based on local laser irradiation Oleg Mavritskii, NRNU MEPhI
12:00	TPA SEE testing procedures at NRL: from system calibration to experiment Adrian Ildefonso, Georgia Tech
12:15	Lunch
	SESSION 3: Case studies
14:00	Development of TPA laser irradiation system with a Cr:forsterite laser and its application to MCU analysis in SOI SRAMs Hiroaki Itsuji, University of Tokyo / JAXA
14:15	SEU sensitivity pattern extraction from asynchronous laser testing using frequency domain analysis Vincent Pouget, IES-CNRS
14:30	Laser testing and analysis of SEE in DDR3 memory components Pierre Kohler, 3DPlus / University of Montpellier
14:45	1064nm Pulsed Laser Experimental Technique for Quantitative SEE Testing Yingqi Ma, NSS CAS
15:00	Single-Photon and two-photon correlation case studies on digital devices Sebastien Jonathas, Pulscan
15:15	Break
15:30	Pulsed laser beam identification of SEE-sensitive regions and observation of additional failure modes relevant for RHA in Digital Isolators Simone Schmitz, Fraunhofer INT
15:45	TPA experiments on analog Phase Locked Loops Jeffrey Prinzie, KU Leuven
	ROUND TABLE
16:00	Do's and don'ts of laser testing: towards a standard approach animated by Renaud Mangeret, Airbus Defence and Space including discussion on sample preparation, laser calibration, reliable screening methods, industrial needs...
16:50	Wrap up & concluding remarks
17:00	Visit of IES laser facilities
17:30	End of the workshop

TECHNICAL PROGRAM